Texas Instruments
제품 번호:
SNJ54BCT8374AFK
제조업체:
패키지:
28-LCCC (11.43x11.43)
배치:
-
설명:
SCAN TEST DEVICES WITH OCTAL D-T
수량:
배달:

지불:
RFQ를 보내 주시면 즉시 응답하겠습니다.

| Operating Temperature | -55°C ~ 125°C |
| Series | 54BCT |
| Package / Case | 28-CLCC |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Mfr | Texas Instruments |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Package | Tube |
| Mounting Type | Surface Mount |
| Product Status | Active |
| Supplier Device Package | 28-LCCC (11.43x11.43) |